Circuit

Probilt™ Probe Card Analyzers

Probe Card Analyzer Accessories

Motherboards

Motherboards

ITC currently manufactures over 100 different motherboard types, including interfaces to all major brands and types of testers. Additionally, ITC has the ability to quickly design and manufacture motherboards for any new tester interface including custom probe cards.

The list of available motherboard types is constantly expanding. If the type you are interested in is not shown here, please contact us.
 

ADVANTEST/VERIGY
T3340 T5331 T5371
T3342 T5332 T5581
T3343 T5334 T6671
T3344 T5335 / 5365 T6682
LM4 / T5375 T2000 / RECT550 5377
T2000FR T5383
VERIGY
4060 VT3300 94000
4071 83000 V4400
9490 93000 V5400
9491 9400 V93000PS
V93000DP
TERADYNE
J937 J995 TIGER
J941 J997 MEGATEST MT-100
J953 A570 MEGATEST GENESIS II
J971 A580 MEGATEST GENESIS III
J973 J750 GEMINI
J993 J750HD FLEX
J994 F750 FLEXUPT
J996 CATALYST IFLEX440
ETS364 INTEGRA
KEITHLY SCHLUMBERGER CREDENCE
5450 SENTRY LT1100
ITS 9000 LT1101
NX SC212 / 312
KX DUO
VALSTAR
KALOS
K2
MT32
Sapphire
Diamond
LTX YOKOGAWA MISCELLANEOUS
SYNCHRO AL6050 48, 70, 88, 120 Pin EC
TRILLIUM TS6700 Hypertac Round Cards
77 ASIA
DELTA 50 VERSATEST
FUSION TI-VLCT
TERADYNE/NexTest Asia / Tact
Maverick 7332
HD 7330
Magnum
ProbeTracker™

ProbeTracker™

Automated Probe Repair System

The ProbeTracker™ is a new concept in probe card repair. As an option on Probilt PB3600 or PB6500 systems, it provides a simple, automatic visual reference for probe position adjustment. With the ProbeTracker™ system, the upper microscope's X, Y position and focus is under control of the Probilt program. Crosshairs on the video image and in the microscope eyepiece are positioned to the optimum location for the selected probe. This makes probe repair an extremely simple, automated process.

Top or Bottom Visual Reference

The Simplicity of the automated repair process can be employed from either the top or bottom side. If a probe is repaired from the top, the Probilt can provide a visual reference for the proper probe position using the on screen video or the isolation pin. A crosshair is positioned over the tip of the probe making it very easy to identify. Probe repairs from the bottom are essentially the same except that the crosshair on the ProbeTracker™ functions as both a pointer to identify the probe to be adjusted and the proper location for the tip.

Automated Probe Positioning

After running an alignment test on the Probilt, the operator may simply click on the probe to be adjusted. The ProbeTracker™ will automatically move the microscope to a position over the probe. The operator has one crosshair pointing to the probe from the top and another to align the probe tip to on the bottom. The alignment of the probe can also be quickly retested by a click on the screen, a mouse shortcut or a keyboard shortcut key. The operator may automatically move to the next probe failing alignment with a simple mouse click or shortcut key and repeat the operation for all failing probes.

Hot Chuck

Hot Chuck

  • Integrated with Probilt Software
  • Measurement temperature up to 125˚C
  • All tests except gram force can be performed
  • Heated air from top rapidly stabalizes temperature and duplicates wafer probe conditions.